|
HTS Number
|
Description
|
Unit of Quantity
|
General Rate of Duty
|
Details
|
|
9031
|
Measuring or checking instruments, appliances and machines, not specified or included elsewhere in this chapter; profile projectors; parts and accessories thereof:
|
|
|
|
|
9031 1000.00
|
Machines for balancing mechanical parts
|
No. |
Free
|
More
|
|
9031 2000.00
|
Test benches
|
No. |
1.7%
|
More
|
|
9031 4100
|
For inspecting semiconductor wafers or devices or for inspecting photomasks or reticles used in manufacturing semiconductor devices
|
|
Free
|
|
|
9031 4100.20
|
For inspecting photomasks or reticles used in manufacturing semiconductor devices
|
No. |
Free
|
More
|
|
9031 4100.40
|
For wafers
|
No. |
Free
|
More
|
|
9031 4100.60
|
Other
|
No. |
Free
|
More
|
|
9031 49
|
Other:
|
|
|
|
|
9031 4910.00
|
Profile projectors
|
No. |
Free
|
More
|
|
9031 4940.00
|
Coordinate-measuring machines
|
No. |
Free
|
More
|
|
9031 4970.00
|
For inspecting masks (other than photomasks) used in manufacturing semiconductor devices; for measuring surface particulate contamination on semiconductor devices
|
No. |
Free
|
More
|
|
9031 4990.00
|
Other
|
No. |
Free
|
More
|
|
9031 80
|
Other instruments, appliances and machines:
|
|
|
|
|
9031 8040.00
|
Electron beam microscopes fitted with equipment specifically designed for the handling and transport of semiconductor wafers or reticles
|
No. |
Free
|
More
|
|
9031 8080
|
Other
|
|
Free
|
|
|
9031 8080.60
|
For testing electrical characteristics
|
kg |
Free
|
More
|
|
9031 8080.70
|
Other
|
kg |
Free
|
More
|
|
9031 8080.85
|
Other
|
kg |
Free
|
More
|
|
9031 90
|
Parts and accessories:
|
|
|
|
|
9031 9021.00
|
Of profile projectors
|
kg |
Free
|
More
|